Wednesday, November 13, 2019
2:00 pm EST
This presentation will highlight some of the current feature extraction challenges that include the explosion of big data, the availability of cheaply sourced aerial imagery, the ubiquity of lidar and the easy-to-use “black box” AI solutions that intensive computing have made easily available. As mapping and remote sensing scientist, we are held to high professional standards when devising solutions to various mapping challenges. This presentation will delve into the exciting opportunities offered up as we try to navigate this brave new world of big data, data science, data mining and machine learning while maintaining the high levels of accuracy and completeness that we have all grown accustomed to.